Descripción del título
![](/OpacDiscovery/img/mat/libro.png)
Monografía
monografia Rebiun35181952 https://catalogo.rebiun.org/rebiun/record/Rebiun35181952 240109s1993 xxua fr 001 0 eng d 1-55937-350-4 UPM 991006123991504212 ES-MaUPM IEEE standard test access port and boundary-scan architecture IEEE Std 1149.1-1990 (includes IEEE Std 1149.1a-1993) [approved by] IEEE Standards Board New York IEEE cop. 1993 New York New York IEEE 1 v. il., gráf. 28 cm 1 v. "Sponsored by the Test Technololgy Standards Committee of the IEEE Computer Society" Normas IEEE. Circuitos impresos. Circuitos integrados. Ingeniería eléctrica. Normas técnicas. IEEE Standards Board IEEE Computer Society. Test Technology Standards Committee