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cover Aberration-corrected analyt...
Aberration-corrected analytical transmission electron microscopy
Wiley 2011

"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--

"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--

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Título:
Aberration-corrected analytical transmission electron microscopy [ Recurso electrónico] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
Editorial:
Hoboken, N.J. : Wiley, 2011
Descripción física:
xv, 280 p., [8] leaves of plates : ill. (some col.)
Mención de serie:
E-Libro
Bibliografía:
Incluye referencias bibliográficas e índice
Detalles del sistema:
Modo de acceso: World Wide Web
Fuente de adquisición directa:
E-Libro
ISBN:
9780470518519 ( hardback)
9781119978848
9781119979906
9781119979913
9781119978855 ( e-book)
Materia:
Autores:

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