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Energy-filtering transmissi...
Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument
Monografía
monografia Rebiun22151346 https://catalogo.rebiun.org/rebiun/record/Rebiun22151346 m o d cr bn||||||abp cr bn||||||ada 101117s1995 gw a ob 001 0 eng d 625345372 934978685 968512304 1001510802 1005788463 1012480891 1016398074 1058218276 9783540489955 electronic bk.) 3540489959 electronic bk.) 9783662140550 print) 3662140551 print) 354058479X Berlin ; acid-free paper) 9783540584797 Berlin ; acid-free paper) 10.1007/978-3-540-48995-5 doi NZ1 15183640 AU@ 000058012454 OCLCE eng pn OCLCE OCLCQ OCLCO NUI GW5XE OCLCQ OCLCF UA@ COO OCLCQ EBLCP OCLCQ YDX UAB VT2 OCLCQ AU@ dlr PHVN bicssc PHVD bicssc SCI009000 bisacsh 535.028 22 42.03 bcl Energy-filtering transmission electron microscopy Ludwig Reimer, ed. ; with contributions by C. Deininger [and others] Berlin New York Springer ©1995 Berlin New York Berlin New York Springer 1 online resource (xi, 424 pages) illustrations 1 online resource (xi, 424 pages) Text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda Springer series in optical sciences v. 71 Includes bibliographical references and index 1. Introduction -- 2. Electron Optics of Imaging Energy Filters -- 3. Plasmons and Related Excitations -- 4. Inner-Shell Ionization -- 5. Quantitative Electron Energy-Loss Spectroscopy -- 6. Electron Spectroscopic Diffraction -- 7. Electron Spectroscopic Imaging -- 8. Energy-Filtered Reflection Electron Microscopy Use copy. Restrictions unspecified star. MiAaHDL Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument Electronic reproduction. [S.l.] HathiTrust Digital Library 2010. MiAaHDL Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL English digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL Transmission electron microscopy Transmission electron microscopy. Electronic books Reimer, Ludwig 1928-) Print version Energy-filtering transmission electron microscopy. Berlin ; New York : Springer, ©1995 (DLC) 94043581 (OCoLC)31657378 Springer series in optical sciences v. 71